Kategorie

Kontaktieren Sie uns

OTF1200XRTP4 Compact Rapid Thermal Processing Tube Furnace with 1100°C Max Temperature and 50°C/s Heating Rate for Semiconductor and Solar Cell Annealing

Designed for rapid thermal annealing of semiconductor wafers and solar cells up to 3" diameter.
Features 8 halogen light heating elements delivering up to 50°C per second heating rate.
Maximum operating temperature of 1100°C for short durations with precise temperature control.
Includes 30-segment programmable controller and RS485 communication for PC monitoring.

Konformität: CE-zertifiziert
Maßgeschneidert: OEM/ODM
Verpackung: Sperrholzkiste

Produkte

OTF1200XRTP4 Compact Rapid Thermal Processing Tube Furnace with 1100°C Max Temperature and 50°C/s Heating Rate for Semiconductor and Solar Cell Annealing

The OTF1200XRTP4 is engineered to meet the demanding thermal annealing requirements of semiconductor wafers and solar cells up to 3 inches in diameter. This compact rapid thermal processing (RTP) tube furnace enables precise, high-speed heating cycles essential for optimizing material properties and device performance in research and production environments.

Utilizing eight 1 kW halogen light tubes as heating elements, the furnace achieves a maximum heating rate of 50°C per second, allowing rapid temperature ramp-up to a peak of 1100°C for short durations. The system incorporates a 30-segment programmable temperature controller with ±1°C accuracy, supporting complex temperature profiles including ramping, dwelling, and cooling phases. Integrated RS485 communication and control software facilitate real-time temperature monitoring and profile management via PC.

Wichtigste Merkmale

  • Maximum temperature of 1100°C for short-term annealing (up to 10 minutes) with controlled cooling options.
  • Eight 1 kW halogen light tubes provide uniform heating over a 12″ zone with a 4″ constant temperature region.
  • High-purity fibrous alumina insulation and double-layer steel casing with air cooling maintain surface temperature below 60°C.
  • 30-segment PID temperature controller with auto-tune and over-temperature/thermocouple failure alarms.
  • Quartz tube (4.33″ O.D x 4.05″ I.D x 16.2″ length) and removable 3″ diameter aluminum nitride sample holder included for optimal thermal uniformity.
  • Vacuum-compatible design with stainless steel KF-D25 flange, water cooling jacket, and optional vacuum pump support.
  • RS485 port and control software enable PC-based temperature profile monitoring and control.

Technische Daten

Parameter Spezifikation
Höchsttemperatur 1100°C (max 10 min), 1000°C (max 20 min), 800°C (max 120 min), 600°C continuous
Erwärmungsgeschwindigkeit Up to 50°C/s (recommended 5°C/s up to 1000°C)
Abkühlgeschwindigkeit Max 60°C/min under vacuum (200 mTorr), 117°C/min atmospheric; minimum 10°C/min
Heizelemente 8 × 1 kW halogen light tubes (10 mm dia × 300 mm length, heated length 200 mm)
Temperaturregler FA-YD808P-AG PID controller, 30 programmable segments, ±1°C accuracy, RS485 port
Quartz Tube 4.33″ O.D × 4.05″ I.D × 16.2″ length
Sample Holder 3″ diameter aluminum nitride plate (removable); optional graphite substrate available
Leistungsaufnahme 208-240 V AC, 50/60 Hz, single-phase, max 9 kW (60 A breaker required)
Vacuum Flange KF-D25 stainless steel flange with double high-temp silicone O-rings, water cooling jacket

Typische Anwendungsbereiche

Ideal for rapid thermal annealing of semiconductor wafers and solar cells, thin-film photovoltaics, graphene processing, and other advanced materials research requiring precise temperature control and rapid heating/cooling cycles.

Hinweise zur Konfiguration und zum Betrieb

The furnace includes a quartz tube, aluminum nitride sample holder, digital vacuum gauge, vacuum ball valve, and necessary O-rings and clamps. Optional accessories include vacuum pumps, water cooling chillers, alternative sample substrates, and advanced temperature controllers with PC software. Water cooling is required for extended operation above 600°C, with recommended flow rates and temperature limits to protect sealing components. Gas flow should be regulated below 3 PSI with a two-stage pressure regulator for safety. The system can be modified for reactive thermal epitaxy (RTE), chemical surface synthesis (CSS), or hot-plate chemical vapor deposition (HPCVD) applications with appropriate crucibles and coatings.

Produktbezogene Informationen

DZF-6050-II laboratory product view 2
UNIPOL-2001 laboratory product view 1
PCE-66 laboratory product view 1
VBF1200XYG laboratory product view 3
Zum Seitenanfang scrollen